
Nov. 26 09:20-10:00

Nov. 27 08:30-09:10

Nov. 26 10:20-10:50

Nov. 26 11:00-11:30

Nov. 27 09:30-10:00(online)

Nov. 26 11:00-11:30

Nov. 26 10:20-10:50

NOV. 26 10:20-10:50

Nov. 26 11:00-11:30

Nov. 26 11:00-11:30
Prof.Rainer Tutsch
<Title>
Holistic lens testing – efficient quality control in lens manufacturing
Dr. Hiroshi Itoh
(AIST), Japan
<Title>
Absolute surface nano-roughness measurement with scanning probe microscope
Prof. Shih-Chi Chen
.
<Title>
Closed-loop two-photon lithography based on a single-cavity dual-comb laser
Dr.Takuya Hosokai
(AIST), Japan.
<Title>
Development of a high-throughput transient photoluminescence spectrometer toward machine learning of functional materials
Prof. Hoshino Tetsuya
.
.
<Title>
New method for absolute surface nano-roughness measurement with scanning probe microscope by using newly developped cantilever
dR.Tadaaki NAGAO
.
<Title>
Nanoscale Optical Resonators for Infrared Spectroscopy and Photoluminescence Applications in Sensing
prof.Yasuhiro Mizutani
.
<Title>
Exploring Measurement Uncertainty in Explainable ML Models for Metrology
Dr. Xiaopeng Li
<Title>
Interpretable machine learning approach for exploring process-structure-property relationships in metal additive manufacturing
To Be Announce